- single event latchup susceptibility
- подверженность одноразовому защелкиванию
English-Russian dictionary of program "Mir-Shuttle". С.В. Курбатов.. 2015.
single event latchup susceptibility
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Single event upset — A single event upset (SEU) is a change of state caused by a low energy ions or electro magnetic or nuclear radiation interferences strike to a sensitive node in a micro electronic device, such as in a microprocessor, semiconductor memory, or… … Wikipedia
Radiation hardening — is a method of designing and testing electronic components and systems to make them resistant to damage or malfunctions caused by ionizing radiation (particle radiation and high energy electromagnetic radiation),[1] such as would be encountered… … Wikipedia
